Your selections:
- Renton, Christopher, Teo, Yik Ren, Perez, Tristan
A compact XYZ scanner for fast atomic force microscopy in constant force contact mode
- Yong, Yuen Kuan, Moheimani, S. O. Reza
- Agüero, Juan C., Rojas, Cristian R., Goodwin, Graham C.
Signal transformation approach to fast nanopositioning
- Sebastian, Abu, Moheimani, S. O. Reza
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